| 发明名称 |
ABNORMALITY DETECTING CIRCUIT AND ABNORMALITY DETECTING METHOD |
| 摘要 |
There is provided an abnormality detecting circuit. A clamp unit is configured to clamp an output voltage which is output from another device, such that the upper limit of the output voltage becomes a first clamp voltage which is generated on the basis of a constant voltage generated from a power supply voltage, or a second clamp voltage which is generated on the basis of the power supply voltage and which varies depending on the power supply voltage. A short-to-power detection unit is configured to compare the output voltage clamped by the clamp unit, with a predetermined threshold value which is generated on the basis of the power supply voltage, thereby detecting occurrence of a short to power. |
| 申请公布号 |
US2016377666(A1) |
申请公布日期 |
2016.12.29 |
| 申请号 |
US201615158168 |
申请日期 |
2016.05.18 |
| 申请人 |
FUJITSU TEN LIMITED |
发明人 |
KUME Masayoshi;KIDO Keisuke |
| 分类号 |
G01R31/02;G01R31/40;H03K5/08 |
主分类号 |
G01R31/02 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An abnormality detecting circuit comprising:
a clamp unit configured to clamp an output voltage which is output from another device, such that the upper limit of the output voltage becomes a first clamp voltage which is generated on the basis of a constant voltage generated from a power supply voltage, or a second clamp voltage which is generated on the basis of the power supply voltage and which varies depending on the power supply voltage; and a short-to-power detection unit configured to compare the output voltage clamped by the clamp unit, with a predetermined threshold value which is generated on the basis of the power supply voltage, thereby detecting occurrence of a short to power. |
| 地址 |
Kobe-shi JP |
