发明名称 CHEMICAL MECHANICAL POLISHING METHOD
摘要 PROBLEM TO BE SOLVED: To meet a need for a high degree of conditioning tolerance when using ceria based abrasive slurry.SOLUTION: A method of chemical mechanical polishing a substrate comprises: providing a polishing machine having a platen; providing a substrate having an exposed silicon oxide surface; providing a chemical mechanical polishing pad comprising a polyurethane polishing layer, where the polyurethane polishing layer composition exhibits an acid number of 0.5 mg(KOH)/g or more; providing an abrasive slurry comprising water and a ceria abrasive; creating dynamic contact at an interface between the chemical mechanical polishing pad and the substrate; and dispensing the abrasive slurry onto a polishing surface of the polyurethane polishing layer of the chemical mechanical polishing pad at or near the interface between the chemical mechanical polishing pad and the substrate.
申请公布号 JP2016007701(A) 申请公布日期 2016.01.18
申请号 JP20150125653 申请日期 2015.06.23
申请人 ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC;DOW GLOBAL TECHNOLOGIES LLC 发明人 QIAN BAINIAN;MARTY DEGROOT;MARK F SONNENSCHEIN
分类号 B24B37/10;B24B37/00;B24B37/013;B24B37/24;B24B37/34;B24B49/12;C09K3/14;H01L21/304 主分类号 B24B37/10
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