发明名称 |
CHEMICAL MECHANICAL POLISHING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To meet a need for a high degree of conditioning tolerance when using ceria based abrasive slurry.SOLUTION: A method of chemical mechanical polishing a substrate comprises: providing a polishing machine having a platen; providing a substrate having an exposed silicon oxide surface; providing a chemical mechanical polishing pad comprising a polyurethane polishing layer, where the polyurethane polishing layer composition exhibits an acid number of 0.5 mg(KOH)/g or more; providing an abrasive slurry comprising water and a ceria abrasive; creating dynamic contact at an interface between the chemical mechanical polishing pad and the substrate; and dispensing the abrasive slurry onto a polishing surface of the polyurethane polishing layer of the chemical mechanical polishing pad at or near the interface between the chemical mechanical polishing pad and the substrate. |
申请公布号 |
JP2016007701(A) |
申请公布日期 |
2016.01.18 |
申请号 |
JP20150125653 |
申请日期 |
2015.06.23 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC;DOW GLOBAL TECHNOLOGIES LLC |
发明人 |
QIAN BAINIAN;MARTY DEGROOT;MARK F SONNENSCHEIN |
分类号 |
B24B37/10;B24B37/00;B24B37/013;B24B37/24;B24B37/34;B24B49/12;C09K3/14;H01L21/304 |
主分类号 |
B24B37/10 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|