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经营范围
发明名称
Apparatus For Inspecting Micro Defects On Strip Samples
摘要
申请公布号
KR100887122(B1)
申请公布日期
2009.03.04
申请号
KR20050083191
申请日期
2005.09.07
申请人
发明人
分类号
G01N21/88;G01N21/47
主分类号
G01N21/88
代理机构
代理人
主权项
地址
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