发明名称 SUBSTRATE SUPPORT WITH IMPROVED RF RETURN
摘要 Apparatus for processing a substrate are provided herein. In some embodiments, a substrate support includes a body having a support surface; an RF electrode disposed in the body proximate the support surface to receive RF current from an RF source; a shaft to support the body; a conductive element having an interior volume and extending through the shaft, wherein the conductive element is coupled to the RF electrode; and an RF gasket; wherein the conductive element includes features that engage the RF gasket to return the RF current to ground.
申请公布号 US2016240426(A1) 申请公布日期 2016.08.18
申请号 US201615019573 申请日期 2016.02.09
申请人 APPLIED MATERIALS, INC. 发明人 KAMATH ARAVIND MIYAR;TSAI CHENG-HSIUNG;RAVI JALLEPALLY;MATSUSHITA TOMOHARU;CHANG YU
分类号 H01L21/687;H01L21/67 主分类号 H01L21/687
代理机构 代理人
主权项 1. A substrate support, comprising: a body having a support surface; an RF electrode disposed in the body proximate the support surface to receive RF current from an RF source; a shaft to support the body; a conductive element having an interior volume and extending through the shaft, wherein the conductive element is coupled to the RF electrode; and an RF gasket, wherein the conductive element includes features that engage the RF gasket to return the RF current to ground.
地址 Santa Clara CA US