发明名称 |
METHODS OF FORMING SENSOR INTEGRATED PACKAGES AND STRUCTURES FORMED THEREBY |
摘要 |
Methods of forming sensor integrated package devices and structures formed thereby are described. An embodiment includes providing a substrate core, wherein a first conductive trace structure and a second conductive trace structure are disposed on the substrate core, forming a cavity between the first conductive trace structure and the second conductive trace structure, and placing a magnet on a resist material disposed on a portion of each of the first and second conductive trace structures, wherein the resist material does not extend over the cavity. |
申请公布号 |
US2016280535(A1) |
申请公布日期 |
2016.09.29 |
申请号 |
US201514671549 |
申请日期 |
2015.03.27 |
申请人 |
Intel Corporation |
发明人 |
Lee Kyu Oh;Zhou Zheng;Salama Islam A.;Eid Feras;Oster Sasha N.;Kong Lay Wai;Soto Gonzalez Javier |
分类号 |
B81B3/00;B81C1/00 |
主分类号 |
B81B3/00 |
代理机构 |
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代理人 |
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主权项 |
1. A microelectronic sensor integrated package structure comprising:
a package substrate comprising a dielectric material; a first conductive trace and a second conductive trace disposed directly on the dielectric material, wherein the first conductive trace is located in a first metal layer of the dielectric material and the second conductive trace is located in a second metal layer of the dielectric material; a resist material disposed directly on a portion of the first conductive trace; a magnet disposed directly on at least a portion of the resist material; and a cavity disposed between the magnet and the first trace, wherein the resist material does not extend across the cavity, and wherein the magnet is directly adjacent the cavity. |
地址 |
Santa Clara CA US |