发明名称 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a preferred positive resist composition superior in etching resistance. <P>SOLUTION: The positive resist composition contains a resin component (A) which has a constitutional unit (a0) derived from an acrylic ester containing a non-acid-dissociable group having a carbon-carbon triple bond, and of which the solubility in an alkali developer increases by the action of an acid, and an acid generator component (B) which generates an acid upon exposure to light. The constitutional unit (a0) may be a constitutional unit (a0-1) represented by a (meth)acrylate containing a triple bond in a side chain. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009086445(A) 申请公布日期 2009.04.23
申请号 JP20070257686 申请日期 2007.10.01
申请人 TOKYO OHKA KOGYO CO LTD 发明人 FUJITA KAZUYOSHI;IWAI TAKESHI;WATABE RYOJI
分类号 G03F7/039;C08F220/10;G03F7/004;G03F7/40;H01L21/027 主分类号 G03F7/039
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