发明名称 FILM SAMPLE FIXING DEVICE, X-RAY ANALYZING DEVICE AND METHOD HAVING THE SAME, FILM MANUFACTURING DEVICE AND METHOD USING THE SAME AND FILM MANUFACTURED WITH THE METHOD
摘要 PROBLEM TO BE SOLVED: To provide a film sample fixing device allowing easy realization of accurate and excellent repetitive reproducibility, even with an analysis object of such a comparatively soft material as a film or an organic substance formed thereon, the film sample fixing device capable of accurately analyzing, and suppressing warpage, swelling, and winkles of a film as low as possible, and an X-ray analyzing device and method having the same, a film manufacturing device and method using the same, and a film manufactured by the method.SOLUTION: A film sample fixing device is provided with an electrification mechanism for charging a film sample and a specimen support for holding the charged film sample. An X-ray analyzing device and method having the same, a film manufacturing device and method using the same, and a film manufactured by the method are also provided.SELECTED DRAWING: Figure 1
申请公布号 JP2016183965(A) 申请公布日期 2016.10.20
申请号 JP20160058179 申请日期 2016.03.23
申请人 FUKUOKA UNIV;TORAY IND INC 发明人 KONO ATSUSHI;TAJIRI YASUYUKI;TOKUNAGA YUKIHIRO;KAMIBAYASHI HIROYUKI
分类号 G01N23/20;G01N23/201;G01N23/203;G01N23/207 主分类号 G01N23/20
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