发明名称 METHODS OF FORMING CONDUCTIVE PILLARS FOR SEMICONDUCTOR DEVICES, METHODS OF FORMING ELECTRICAL INTERCONNECTS, AND SEMICONDUCTOR DEVICES
摘要 A method of forming a conductive material on a semiconductor device. The method comprises removing at least a portion of a conductive pad within an aperture in a dielectric material over a substrate. The method further comprises forming a seed material at least within a bottom of the aperture and over the dielectric material, forming a protective material over the seed material within the aperture, and forming a conductive pillar in contact with the seed material through an opening in the protective material over surfaces of the seed material within the aperture. A method of forming an electrical connection between adjacent semiconductor devices, and a semiconductor device, are also described.
申请公布号 US2016225731(A1) 申请公布日期 2016.08.04
申请号 US201514608466 申请日期 2015.01.29
申请人 Micron Technology, Inc. 发明人 Chandolu Anilkumar;Hagen Kenneth N.
分类号 H01L23/00;H01L21/66 主分类号 H01L23/00
代理机构 代理人
主权项 1. A method of forming a conductive material on a semiconductor device, the method comprising: removing at least a portion of a conductive pad within an aperture in a dielectric material over a substrate; forming a seed material at least within a bottom of the aperture and over the dielectric material; forming a protective material over the seed material within the aperture; and forming a conductive pillar in contact with the seed material through an opening in the protective material over surfaces of the seed material within the aperture.
地址 Boise ID US