发明名称 |
METHODS OF FORMING CONDUCTIVE PILLARS FOR SEMICONDUCTOR DEVICES, METHODS OF FORMING ELECTRICAL INTERCONNECTS, AND SEMICONDUCTOR DEVICES |
摘要 |
A method of forming a conductive material on a semiconductor device. The method comprises removing at least a portion of a conductive pad within an aperture in a dielectric material over a substrate. The method further comprises forming a seed material at least within a bottom of the aperture and over the dielectric material, forming a protective material over the seed material within the aperture, and forming a conductive pillar in contact with the seed material through an opening in the protective material over surfaces of the seed material within the aperture. A method of forming an electrical connection between adjacent semiconductor devices, and a semiconductor device, are also described. |
申请公布号 |
US2016225731(A1) |
申请公布日期 |
2016.08.04 |
申请号 |
US201514608466 |
申请日期 |
2015.01.29 |
申请人 |
Micron Technology, Inc. |
发明人 |
Chandolu Anilkumar;Hagen Kenneth N. |
分类号 |
H01L23/00;H01L21/66 |
主分类号 |
H01L23/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a conductive material on a semiconductor device, the method comprising:
removing at least a portion of a conductive pad within an aperture in a dielectric material over a substrate; forming a seed material at least within a bottom of the aperture and over the dielectric material; forming a protective material over the seed material within the aperture; and forming a conductive pillar in contact with the seed material through an opening in the protective material over surfaces of the seed material within the aperture. |
地址 |
Boise ID US |