| 摘要 |
An emblem and an emblem inspection apparatus are provided to measure an adhered extent of a mark adhered on a base plate by using through-holes formed on the base plate, thereby shortening a working time. An emblem includes a base plate(20) and a certain mark(11) adhered on the base plate by an adhesive member. At least one through-hole(13,14) is formed on an adhesive surface of the base plate, and an object is inserted into the through-hole to verify an adhesive extent of the adhesive member. The adhesive member is a double-sided tape. |
