发明名称 |
DEVICES HAVING MULTIPLE THRESHOLD VOLTAGES AND METHOD OF FABRICATING SUCH DEVICES |
摘要 |
Methods of fabricating devices (e.g., FDSOI devices) having multiple threshold voltages are described. One method includes providing a first fixed charge region proximate to an interface of an insulating (e.g., buried oxide (BOX) layer) and a semiconductor substrate for a first device. The first charge region has a first configuration of fixed charges. The method also includes providing a second fixed charge region proximate to the interface of the insulating layer and the semiconductor substrate for the second device. The second charge region has a second configuration of fixed charges that is different than the first configuration. |
申请公布号 |
US2016300838(A1) |
申请公布日期 |
2016.10.13 |
申请号 |
US201514704511 |
申请日期 |
2015.05.05 |
申请人 |
Broadcom Corporation |
发明人 |
Zhang Qintao;Xing Aimin |
分类号 |
H01L27/092;H01L21/84;H01L21/265;H01L29/78;H01L29/167;H01L21/8238;H01L29/06 |
主分类号 |
H01L27/092 |
代理机构 |
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代理人 |
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主权项 |
1. A method of fabricating devices on a semiconductor substrate, the method comprising:
providing a first fixed charge region to the semiconductor substrate below an interface between an insulating layer above the semiconductor substrate and the semiconductor substrate for a first device of the devices, the first fixed charge region having a first configuration; and providing a second fixed charge region to the semiconductor substrate below an interface between the insulating layer above the semiconductor substrate and the semiconductor substrate for a second device of the devices, the second fixed charge region having a second configuration, the first configuration being different than the second configuration. |
地址 |
Irvine CA US |