发明名称 Bandgap Reference Circuit and Method for Room Temperature Trimming with Replica Elements
摘要 A method and circuit for trimming a bandgap reference are described. The bandgap reference circuit comprises a first diode which is arranged in series with a first resistor between a reference point and a reference potential VSS. The circuit also comprises a second diode which is arranged in series with a second resistor and a third resistor between the reference point and the reference potential VSS. In addition, the bandgap reference circuit comprises a trimming network, wherein a bandgap reference voltage VBG CORE is provided at a midpoint between the trimming network and the current source. The circuit also comprises an operational amplifier. The method (700) comprises measuring a first diode voltage across a replica element of the first diode; determining a first resistance of a replica element of the first resistor; and setting a resistance of the trimming network using the first diode voltage and the first resistance.
申请公布号 US2016334816(A1) 申请公布日期 2016.11.17
申请号 US201514713539 申请日期 2015.05.15
申请人 Dialog Semiconductor (UK) Limited 发明人 Ji Cang
分类号 G05F1/46 主分类号 G05F1/46
代理机构 代理人
主权项 1) A method for trimming a bandgap reference circuit, wherein the bandgap reference circuit comprises the steps of: arranging a first diode in series with a first resistor between a reference point and a reference potential; arranging a second diode in series with a second resistor and a third resistor between the reference point and the reference potential; arranging a trimming network in series with a current source between the to reference point and a supply voltage; wherein a bandgap reference voltage is provided at a midpoint between the trimming network and the current source; and coupling a first input of an operational amplifier to a midpoint between the first diode and the first resistor, wherein a second input of the operational amplifier is coupled to a midpoint between the second resistor and the third resistor, and wherein an output of the operational amplifier is used to control the current source; wherein the method further comprises the steps of: measuring a first diode voltage across a replica element of the first diode; determining a first resistance of a replica element of the first resistor; and setting a resistance of the trimming network using the first diode voltage and the first resistance.
地址 Reading GB