发明名称 PHOTOSENSITIZATION CHEMICAL-AMPLIFICATION TYPE RESIST MATERIAL, METHOD FOR FORMING PATTERN USING SAME, SEMICONDUCTOR DEVICE, MASK FOR LITHOGRAPHY, AND TEMPLATE FOR NANOIMPRINTING
摘要 A photosensitization chemical-amplification type resist material according to the present invention is used for a two-stage exposure lithography process, and contains (1) a developable base component and (2) a component generating a photosensitizer and an acid through exposure. Among three components consisting of (a) an acid-photosensitizer generator, (b) a photosensitizer precursor, and (c) a photoacid generator, the above component contains only the component (a), any two components, or all of the components (a) to (c).
申请公布号 SG11201606813T(A) 申请公布日期 2016.09.29
申请号 SGT11201606813 申请日期 2015.02.17
申请人 TOKYO ELECTRON LIMITED;OSAKA UNIVERSITY 发明人 NAGAHARA SEIJI;TAGAWA SEIICHI;OSHIMA AKIHIRO
分类号 G03F7/38;G03F7/004;G03F7/038;G03F7/039;G03F7/11;H01L21/027 主分类号 G03F7/38
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