发明名称 |
PHOTOSENSITIZATION CHEMICAL-AMPLIFICATION TYPE RESIST MATERIAL, METHOD FOR FORMING PATTERN USING SAME, SEMICONDUCTOR DEVICE, MASK FOR LITHOGRAPHY, AND TEMPLATE FOR NANOIMPRINTING |
摘要 |
A photosensitization chemical-amplification type resist material according to the present invention is used for a two-stage exposure lithography process, and contains (1) a developable base component and (2) a component generating a photosensitizer and an acid through exposure. Among three components consisting of (a) an acid-photosensitizer generator, (b) a photosensitizer precursor, and (c) a photoacid generator, the above component contains only the component (a), any two components, or all of the components (a) to (c). |
申请公布号 |
SG11201606813T(A) |
申请公布日期 |
2016.09.29 |
申请号 |
SGT11201606813 |
申请日期 |
2015.02.17 |
申请人 |
TOKYO ELECTRON LIMITED;OSAKA UNIVERSITY |
发明人 |
NAGAHARA SEIJI;TAGAWA SEIICHI;OSHIMA AKIHIRO |
分类号 |
G03F7/38;G03F7/004;G03F7/038;G03F7/039;G03F7/11;H01L21/027 |
主分类号 |
G03F7/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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