发明名称 IN-SITU BIAS CORRECTION FOR MEMS ACCELEROMETERS
摘要 In some examples, an accelerometer may self-calibrate while in use by setting a scale factor of the accelerometer to a first value; while the scale factor of the accelerometer is set to the first value, obtaining a first acceleration value; setting the scale factor of the accelerometer to a second value; while the scale factor of the accelerometer is set to the second value, obtaining a second acceleration value; based on the first acceleration value and the second acceleration value, determining a bias correction value; obtaining a third acceleration value; and correcting the third acceleration value based on the bias correction value.
申请公布号 US2016334441(A1) 申请公布日期 2016.11.17
申请号 US201514951132 申请日期 2015.11.24
申请人 Honeywell International Inc. 发明人 Tin Steven;Fertig Chad
分类号 G01P21/00 主分类号 G01P21/00
代理机构 代理人
主权项 1. A method of calibrating an accelerometer, the method comprising: setting a scale factor of the accelerometer to a first value; while the scale factor of the accelerometer is set to the first value, obtaining a first acceleration value; setting the scale factor of the accelerometer to a second value; while the scale factor of the accelerometer is set to the second value, obtaining a second acceleration value; based on the first acceleration value and the second acceleration value, determining a bias correction value; obtaining a third acceleration value; and correcting the third acceleration value based on the bias correction value.
地址 Morris Plains NJ US