发明名称 |
IN-SITU BIAS CORRECTION FOR MEMS ACCELEROMETERS |
摘要 |
In some examples, an accelerometer may self-calibrate while in use by setting a scale factor of the accelerometer to a first value; while the scale factor of the accelerometer is set to the first value, obtaining a first acceleration value; setting the scale factor of the accelerometer to a second value; while the scale factor of the accelerometer is set to the second value, obtaining a second acceleration value; based on the first acceleration value and the second acceleration value, determining a bias correction value; obtaining a third acceleration value; and correcting the third acceleration value based on the bias correction value. |
申请公布号 |
US2016334441(A1) |
申请公布日期 |
2016.11.17 |
申请号 |
US201514951132 |
申请日期 |
2015.11.24 |
申请人 |
Honeywell International Inc. |
发明人 |
Tin Steven;Fertig Chad |
分类号 |
G01P21/00 |
主分类号 |
G01P21/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of calibrating an accelerometer, the method comprising:
setting a scale factor of the accelerometer to a first value; while the scale factor of the accelerometer is set to the first value, obtaining a first acceleration value; setting the scale factor of the accelerometer to a second value; while the scale factor of the accelerometer is set to the second value, obtaining a second acceleration value; based on the first acceleration value and the second acceleration value, determining a bias correction value; obtaining a third acceleration value; and correcting the third acceleration value based on the bias correction value. |
地址 |
Morris Plains NJ US |