发明名称 Selective refractometry of materials involves sensitizing measuring surface of measurement prism before material to be tested is set on measuring surface for refractive index determination
摘要 The method involves setting a material to be tested on the measuring surface of a measurement prism, and illuminating material with light radiated in an angle included in the critical angle of total reflection in the receiving surface to determine refractive index of the material. The measuring surface sensitized based on the material before material is set on measuring surface.
申请公布号 DE10025788(A1) 申请公布日期 2001.11.22
申请号 DE2000125788 申请日期 2000.05.19
申请人 FRANZ SCHMIDT & HAENSCH GMBH & CO. KG 发明人 YILMAZ, SUEKRUE;KUCHEJDA, MATHIS
分类号 G01N21/43;G01N21/552;(IPC1-7):G01N21/55 主分类号 G01N21/43
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