发明名称 PHOTOMASK FOR ACTIVE MATRIX TYPE DISPLAY APPARATUS AND METHOD FOR MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a photomask used for a method of manufacturing an LCD, the photomask which forms islands in an a-Si layer including a signal terminal region while suppressing an increase in photolithography process and suppresses an increase in parasitic capacitance as a whole. <P>SOLUTION: The photomask (590-1, 590-2) includes light-shielding portions (520-1, 520-2) in figures corresponding to a part of a drain electrode and a source electrode, and semitransparent portions (510-1, 510-2, 510-3, 510-4) in figures corresponding to other part of the drain electrode and the source electrode, a signal line, a signal terminal metal electrode and a leader line. By using the mask, a thin resist pattern can be formed in regions where the signal line, the signal leader line, the signal terminal, a part of the drain electrode and a part of the source electrode are to be formed, and a relatively thick resist pattern can be formed in a region with a short distance from a position where the drain electrode and the source electrode oppose to each other to over the gate electrode width. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006154122(A) 申请公布日期 2006.06.15
申请号 JP20040342782 申请日期 2004.11.26
申请人 NEC LCD TECHNOLOGIES LTD;NEC KAGOSHIMA LTD;DAINIPPON PRINTING CO LTD 发明人 TAKAHASHI YOSHITOMO;MURAYAMA YOICHI;MORI HIROSHI;HIDA ATSUSHI;KUNIYOSHI MASAMI;BAN KIYOTO;KIDO SHUSAKU
分类号 G02F1/1368;G03F1/00;G03F1/68;H01L21/027;H01L21/336;H01L29/786 主分类号 G02F1/1368
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