发明名称 MOS FIELD EFFECT TRANSISTOR HAVING TRENCH ISOLATION REGION AND METHOD OF FABRICATING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a MOS field effect transistor having a trench isolation region and a method of fabricating the same. SOLUTION: In the transistor, a trench isolation region is disposed in a predetermined portion of a semiconductor substrate to define an active region. A source region and a drain region are spaced apart from each other within the active region with a channel region disposed between the source region and the drain region. A gate electrode crosses over the channel region between the source region and the drain region, and a gate insulating layer is disposed between the gate electrode and the channel region. An edge insulating layer thicker than the gate insulating layer is disposed on a lower portion of the gate electrode around the boundary of the trench isolation region and the active region. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006344943(A) 申请公布日期 2006.12.21
申请号 JP20060143089 申请日期 2006.05.23
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIM MYOUNG-SOO
分类号 H01L29/78;H01L21/76 主分类号 H01L29/78
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