发明名称 MEMS Integrated Pressure Sensor Devices Having Isotropic Cavitites and Methods of Forming Same
摘要 A method embodiment includes providing a MEMS wafer comprising an oxide layer, a MEMS substrate, a polysilicon layer. A carrier wafer comprising a first cavity formed using isotropic etching is bonded to the MEMS, wherein the first cavity is aligned with an exposed first portion of the polysilicon layer. The MEMS substrate is patterned, and portions of the sacrificial oxide layer are removed to form a first and second MEMS structure. A cap wafer including a second cavity is bonded to the MEMS wafer, wherein the bonding creates a first sealed cavity including the second cavity aligned to the first MEMS structure, and wherein the second MEMS structure is disposed between a second portion of the polysilicon layer and the cap wafer. Portions of the carrier wafer are removed so that first cavity acts as a channel to ambient pressure for the first MEMS structure.
申请公布号 US2016159643(A1) 申请公布日期 2016.06.09
申请号 US201615041886 申请日期 2016.02.11
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chu Chia-Hua;Cheng Chun-Wen
分类号 B81B7/02;B81C1/00 主分类号 B81B7/02
代理机构 代理人
主权项 1. A method comprising: disposing a first surface of a membrane for a first micro-electromechanical (MEMS) device in a first sealed cavity; and exposing a second surface of the membrane to an ambient pressure level, wherein exposing the second surface comprises: patterning one or more openings in a carrier using a first etching process;connecting bottom portions of the one or more openings using a second etching process to form a second cavity;aligning the second cavity with the second surface of the membrane; andexposing the second cavity to the ambient pressure level.
地址 Hsin-Chu TW