发明名称 |
METHOD OF INSPECTING SUBSTRATE FOR DISPLAY |
摘要 |
PROBLEM TO BE SOLVED: To provide stable contact even when a transparent conductive film is an IZO film. SOLUTION: In this inspection method, a needle tip of a probe provided with the sharp needle tip having a hardness of a range over from HV500 to HV100 is pressed onto an electrode of a substrate for display to bring contact face pressure between the electrode and the needle tip into 0.04-0.06 g/μm<SP>2</SP>. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2006343307(A) |
申请公布日期 |
2006.12.21 |
申请号 |
JP20050295268 |
申请日期 |
2005.10.07 |
申请人 |
MICRONICS JAPAN CO LTD |
发明人 |
KUGA TOMOAKI;YASUDA TAKAO;DEWA HARUMASA |
分类号 |
G01R1/073;G01R31/00;G02F1/13;G02F1/1343 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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