发明名称 METHOD OF INSPECTING SUBSTRATE FOR DISPLAY
摘要 PROBLEM TO BE SOLVED: To provide stable contact even when a transparent conductive film is an IZO film. SOLUTION: In this inspection method, a needle tip of a probe provided with the sharp needle tip having a hardness of a range over from HV500 to HV100 is pressed onto an electrode of a substrate for display to bring contact face pressure between the electrode and the needle tip into 0.04-0.06 g/μm<SP>2</SP>. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006343307(A) 申请公布日期 2006.12.21
申请号 JP20050295268 申请日期 2005.10.07
申请人 MICRONICS JAPAN CO LTD 发明人 KUGA TOMOAKI;YASUDA TAKAO;DEWA HARUMASA
分类号 G01R1/073;G01R31/00;G02F1/13;G02F1/1343 主分类号 G01R1/073
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