发明名称 POSITIVE PHOTOSENSITIVE POLYAMIDEIMIDE RESIN COMPOSITION, METHOD FOR PRODUCING PATTERN, AND ELECTRONIC COMPONENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive photosensitive polyamideimide resin composition which excels in sensitivity, resolution, adhesion in development, and heat resistance, can be exposed with an i-line and developed with an alkaline aqueous solution, and yields a pattern of a good profile, a method for producing a pattern and an electronic component. <P>SOLUTION: The positive photosensitive polyamideimide resin composition comprises a polyamideimide (A) soluble in an alkaline aqueous solution and obtained by reacting a diamine (a1) having a phenolic hydroxyl group with a tricarboxylic acid monoanhydride (a2) and reacting the resulting diimidodicarboxylic acid with a diisocyanate (a3), a compound (B) which generates an acid under light, a solvent (C), and a compound (D) having an organic group convertible to a carboxylic acid by acid catalysis. The electronic component has a layer of a pattern as an interlayer insulation film layer or a surface protective film layer in an electronic device. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007240555(A) 申请公布日期 2007.09.20
申请号 JP20060058679 申请日期 2006.03.03
申请人 HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD 发明人 MATSUTANI HIROSHI;MINEGISHI TOMONORI;MASUDA KATSUYUKI
分类号 G03F7/038;C08G73/14;G03F7/004;G03F7/039;H01L21/027 主分类号 G03F7/038
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