发明名称 METHOD OF SCREENING QUALITY OF SEMICONDUCTOR LASER AND ITS QUALITY SCREENING DEVICE
摘要 PROBLEM TO BE SOLVED: To improve yield by efficiently deciding the quality of a semiconductor laser in a screening step using a pulse current. SOLUTION: The method of screening the quality of a semiconductor laser includes pulse current injection steps (S2, S3, and S5) of sequentially injecting a plurality of pulse currents having energy for giving a heat load to a semiconductor laser for oscillating single lateral mode laser light, a measuring step (S4) of measuring a light output outputted by the semiconductor laser for each of the plurality of pulse currents by use of the pulse current injected in the pulse current injection step, and decision steps (S6, S10, and S11) of deciding the quality of the semiconductor laser based on a relationship between the current value of the pulse current injected in the pulse current injection step and the light output measured in the measuring step. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009004422(A) 申请公布日期 2009.01.08
申请号 JP20070161150 申请日期 2007.06.19
申请人 ANRITSU CORP 发明人 NAGASHIMA YASUAKI
分类号 H01S5/00;G01R31/26 主分类号 H01S5/00
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