发明名称 |
SUBSTRATE PROCESSING APPARATUS, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, PROGRAM AND RECORDING MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To partially adjust a plasma distribution in a processing region in order to suppress reduction in the in-plane uniformity of a film formed on a substrate.SOLUTION: The substrate processing apparatus comprises: a substrate placement part for placing a substrate; a division structure for forming a processing region in a space facing the substrate placement; a gas supplying part for supplying processing gas to the processing region having the formed division structure; and a plasma generation part for bringing the processing gas supplied to the processing region by the gas supplying part into a plasma state to generate active species of the processing gas and independently controlling the degree of activity of the active species for each portion of the processing region when brought into the plasma state.SELECTED DRAWING: Figure 9 |
申请公布号 |
JP2016176129(A) |
申请公布日期 |
2016.10.06 |
申请号 |
JP20150058326 |
申请日期 |
2015.03.20 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
OHASHI TADASHI;TOYODA KAZUYUKI;MATSUI SHUN |
分类号 |
C23C16/509;C23C16/52;H01L21/205;H01L21/31;H05H1/46 |
主分类号 |
C23C16/509 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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