发明名称 STRUCTURE AND METHOD OF SEMICONDUCTOR DEVICE STRUCTURE WITH GATE
摘要 A semiconductor device structure is provided. The semiconductor device structure includes a semiconductor substrate. The semiconductor device structure includes a gate stack over the semiconductor substrate. The semiconductor device structure includes spacers over opposite sidewalls of the gate stack. The spacers and the gate stack surround a recess over the gate stack. The semiconductor device structure includes a first insulating layer over the gate stack and an inner wall of the recess. The semiconductor device structure includes a second insulating layer over the first insulating layer. Materials of the first insulating layer and the second insulating layer are different, and a first thickness of the first insulating layer is less than a second thickness of the second insulating layer.
申请公布号 US2016307758(A1) 申请公布日期 2016.10.20
申请号 US201514689647 申请日期 2015.04.17
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LI Jing-Yang;WU Chun-Sheng;LIU Ding-I;LI Yi-Fang
分类号 H01L21/28;H01L29/423;H01L29/78;H01L29/66;H01L21/02 主分类号 H01L21/28
代理机构 代理人
主权项 1. A semiconductor device structure, comprising: a semiconductor substrate; a gate stack over the semiconductor substrate, wherein the gate stack comprises a gate dielectric layer and a metal gate; spacers over opposite sidewalls of the gate stack, wherein the spacers and the gate stack surround a recess over the gate stack; a first insulating layer over the gate stack and an inner wall of the recess, wherein a top surface of the gate dielectric layer is between the semiconductor substrate and a bottom surface of the first insulating layer; and a second insulating layer over the first insulating layer, wherein materials of the first insulating layer and the second insulating layer are different, and a first thickness of the first insulating layer is less than a second thickness of the second insulating layer.
地址 Hsin-Chu TW