发明名称 SEMICONDUCTOR FABRICATION FACILITY DATA COLLECTION SYSTEM
摘要 A system and method for collecting and analyzing real-time data generated by different semiconductor fabrication tools in a semiconductor fabrication facility, and allowing a user to access said data remote from the semiconductor fabrication facility.
申请公布号 US2016365262(A1) 申请公布日期 2016.12.15
申请号 US201514740077 申请日期 2015.06.15
申请人 Haws Corporation 发明人 Peek Benjamin R.
分类号 H01L21/67 主分类号 H01L21/67
代理机构 代理人
主权项 1. A fabrication data collection system comprising: a semiconductor tool data collection unit comprising: a data collector, a semiconductor fabrication tool, an energy monitor, and a fluid flow monitor; wherein the semiconductor fabrication tool includes sensors to output tool characteristics, and the tool characteristics output is communicated to the data collector; wherein the energy monitor outputs an amount of energy used by the semiconductor fabrication tool, and the energy monitor output is communicated to the data collector; wherein the fluid flow monitor outputs a fluid flow rate of the semiconductor fabrication tool, and the fluid flow rate output is communicated to the data collector; wherein the semiconductor tool data collection unit is configured to communicate the outputs to one more servers using a network switch, wherein the network switch is configured to receive a communication from one or more semiconductor tool data collection units; wherein the servers are configured to store the outputs and/or perform analysis on the one or more communications from the one or more semiconductor tool data collection units, and to connect to a public network through a secure firewall, such that one or more authorized users are remotely able to access information on the servers though the public network via the secure firewall.
地址 Sparks NV US