发明名称 SYSTEM AND METHOD FOR LEARNING AND/OR OPTIMIZING MANUFACTURING PROCESSES
摘要 A system and method for learning and/or optimizing processes related to semiconductor manufacturing is provided. A learning component generates a set of candidate process models based on process data associated with one or more fabrication tools. The learning component also selects a particular process model from the set of candidate process models that is associated with lowest error. An optimization component generates a set of candidate solutions associated with the particular process model. The optimization component also selects a particular solution from the set of candidate solutions based on a target output value and an output value associated with the particular solution.
申请公布号 US2016307116(A1) 申请公布日期 2016.10.20
申请号 US201615195380 申请日期 2016.06.28
申请人 TOKYO ELECTRON LIMITED 发明人 Kaushal Sanjeev;Patel Sukesh Janubhai
分类号 G06N99/00;G05B19/418 主分类号 G06N99/00
代理机构 代理人
主权项 1. A system, comprising: a memory storing computer executable components; and a processor configured to execute the following computer executable components stored in the memory: a learning component that generates a set of candidate process models based on process data associated with one or more fabrication tools and selects a particular process model from the set of candidate process models based on a first defined criterion; andan optimization component that generates a set of candidate solutions associated with the particular process model and selects a particular solution from the set of candidate solutions based on a second defined criterion.
地址 TOKYO JP