发明名称 |
SYSTEM AND METHOD FOR LEARNING AND/OR OPTIMIZING MANUFACTURING PROCESSES |
摘要 |
A system and method for learning and/or optimizing processes related to semiconductor manufacturing is provided. A learning component generates a set of candidate process models based on process data associated with one or more fabrication tools. The learning component also selects a particular process model from the set of candidate process models that is associated with lowest error. An optimization component generates a set of candidate solutions associated with the particular process model. The optimization component also selects a particular solution from the set of candidate solutions based on a target output value and an output value associated with the particular solution. |
申请公布号 |
US2016307116(A1) |
申请公布日期 |
2016.10.20 |
申请号 |
US201615195380 |
申请日期 |
2016.06.28 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
Kaushal Sanjeev;Patel Sukesh Janubhai |
分类号 |
G06N99/00;G05B19/418 |
主分类号 |
G06N99/00 |
代理机构 |
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代理人 |
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主权项 |
1. A system, comprising:
a memory storing computer executable components; and a processor configured to execute the following computer executable components stored in the memory:
a learning component that generates a set of candidate process models based on process data associated with one or more fabrication tools and selects a particular process model from the set of candidate process models based on a first defined criterion; andan optimization component that generates a set of candidate solutions associated with the particular process model and selects a particular solution from the set of candidate solutions based on a second defined criterion. |
地址 |
TOKYO JP |