发明名称 FILM FORMATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a new and useful film formation method capable of forming a semiconductor film excellent in electric characteristics.SOLUTION: A precursor solution of a first semiconductor is atomized or made into droplets, the obtained mist or droplets are carried into a film formation chamber by carrier gas and the mist or the droplets are thermally reacted to form a first semiconductor film on a substrate installed in the film formation chamber. After insulating the first semiconductor film composed of the first semiconductor, a precursor solution of a second semiconductor is atomized or made into droplets, the obtained mist or droplets are carried into the film formation chamber by carrier gas and the mist or the droplets are thermally reacted in the film formation chamber to form a second semiconductor film composed of the second semiconductor on the insulated first semiconductor film.SELECTED DRAWING: None
申请公布号 JP2016207911(A) 申请公布日期 2016.12.08
申请号 JP20150090050 申请日期 2015.04.27
申请人 KYOTO UNIV;FLOSFIA INC 发明人 AKAIWA KAZUAKI;KANEKO KENTARO;FUJITA SHIZUO;ODA SHINYA;HITORA TOSHIMI
分类号 H01L21/365;C23C16/40;C23C16/448;H01L21/336;H01L21/368;H01L29/786 主分类号 H01L21/365
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