发明名称 |
MULTIWAVELENGTH LASER LIGHT SOURCE AND INDUCTIVE EMISSION SUPPRESSION MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To provide a small-sized multiwavelength laser light source capable of outputting laser lights of different two or more wavelengths while easily matching optical axes, and an inductive emission suppression microscope.SOLUTION: The inductive emission suppression microscope comprises: an objective lens 60 to which two or more laser lights emitted from the multiwavelength laser light source are incident and which irradiates an object to be measured with the laser lights of the wavelengths; and a camera for monitoring a laser light that is outputted from the object to be measured by radiating the laser lights. A diffraction grating layer 6 of the multiwavelength laser light source includes a first diffraction grating region and a second diffraction grating region.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016207858(A) |
申请公布日期 |
2016.12.08 |
申请号 |
JP20150088461 |
申请日期 |
2015.04.23 |
申请人 |
HAMAMATSU PHOTONICS KK |
发明人 |
TAKIGUCHI MASARU;NOMOTO YOSHIAKI;SUGIYAMA TAKAHIRO |
分类号 |
H01S5/12;G02B21/06;H01S5/02;H01S5/30;H01S5/34 |
主分类号 |
H01S5/12 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|