| 摘要 |
An edge measurement method of a test material and an electricity test method using the same are provided to improve the correct recognition rate of a wafer by removing noise with a digital image processing as a software method. An electricity test method comprises: a step for obtaining a first video data by scanning the image of objects for an electricity test(S210); a step for obtaining a second video data in which noise is removed by filtering the first video data; a step for setting up the edge region of the objects as a coordinate standard value to the second video data; a step for obtaining the coordinate of an electricity test domain of the objects by utilizing the coordinate standard value; and a step for arranging a device for an electrical test and inspecting the objects by using the barycentric coordinates of the objects(S270).
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