发明名称 Radiation imaging device with metal-insulator-semiconductor photodetector and thin film transistor
摘要 A photosensor pixel includes a thin film transistor (TFT) and a metal-insulator-semiconductor (MIS) photodetector. The TFT includes a gate, a gate insulator layer, a semiconductor layer forming a channel region, a drain, and a source. The MIS photodetector includes a transparent conductor layer, a semiconductor layer including a photosensitive semiconductor, and an insulator layer between the transparent conductor layer and the semiconductor layer. The semiconductor layer of the MIS photodetector is connected to the source or the drain of the TFT, and the thickness of the insulator layer of the MIS photodetector is less than the thickness of the gate insulator layer of the TFT.
申请公布号 US9515106(B2) 申请公布日期 2016.12.06
申请号 US201414537711 申请日期 2014.11.10
申请人 PerkinElmer Holdings, Inc. 发明人 Taghibakhsh Farhad
分类号 H01L27/146;G01T1/20;H01L27/12 主分类号 H01L27/146
代理机构 Morrison & Foerster LLP 代理人 Morrison & Foerster LLP
主权项 1. A photosensor pixel comprising: a thin film transistor (TFT), the TFT comprising: a gate;a gate insulator layer;a semiconductor layer forming a channel region;a drain; anda source; and a metal-insulator-semiconductor (MIS) photodetector, the MIS photodetector comprising: a transparent conductor layer;a semiconductor layer including a photosensitive semiconductor; andan insulator layer between the transparent conductor layer and the semiconductor layer, wherein the semiconductor layer of the MIS photodetector is electrically connected to the source or the drain of the TFT, andthe thickness of the insulator layer of the MIS photodetector is less than the thickness of the gate insulator layer of the TFT.
地址 Waltham MA US