发明名称 SEMICONDUCTOR DEVICES AND FABRICATION METHOD THEREOF
摘要 A method is provided for fabricating a semiconductor device. The method includes providing a semiconductor substrate; and forming a first gate structure on the semiconductor substrate. The method also includes forming offset spacers doped with a certain type of ions to increase an anti-corrosion ability of the offset spacers on both sides of the first gate structure by a stability doping process; and forming trenches in the semiconductor substrate at both sides of the first gate structures. Further, the method includes forming stress layers in the trenches.
申请公布号 US2016247922(A1) 申请公布日期 2016.08.25
申请号 US201615147397 申请日期 2016.05.05
申请人 Semiconductor Manufacturing International (Shanghai) Corporation 发明人 HE YONGGEN
分类号 H01L29/78;H01L21/8234;H01L29/45;H01L29/165;H01L21/027;H01L21/324;H01L21/02;H01L29/06;H01L29/66;H01L21/3115 主分类号 H01L29/78
代理机构 代理人
主权项
地址 Shanghai CN