发明名称 半導体装置及びその製造方法
摘要 A semiconductor device (100) comprises: a semiconductor substrate (1); a drift region (2) of a first conductivity type having a trench in part of an upper portion thereof and arranged on a first main surface of the semiconductor substrate (100); an electric field reducing region (4) of a second conductivity type arranged, in a bottom portion of the trench, only around a corner portion and not in a center portion; an anode electrode (9) embedded in the trench; and a cathode electrode (10) arranged on a second main surface of the semiconductor substrate (100) which is opposite to the first main surface.
申请公布号 JP6028807(B2) 申请公布日期 2016.11.24
申请号 JP20140542166 申请日期 2013.10.17
申请人 日産自動車株式会社 发明人 丸井 俊治;林 哲也;山上 滋春;倪 威;江森 健太
分类号 H01L29/861;H01L21/329;H01L29/06;H01L29/47;H01L29/868;H01L29/872 主分类号 H01L29/861
代理机构 代理人
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