发明名称 PATENT SPECIFICATION ANALYSIS DISPLAY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a patent specification analysis display device which intends to check a patent specification in a shorter period, and especially, can check also in consideration of the scope of rights and a patent rate including the description of an intermediate concept more easily. SOLUTION: The device automatically extracts, from the description of the patent specification, the entire or a part of the invention concept described in the patent specification, including the concept not claimed in the scope of claims for patent, identifies the hierarchical relationship of the extracted invention concept and the measure of the working effect thereof, displays the hierarchical relationship of the identified invention concept, and reflects the measure of the working effect on the invention concept to be displayed. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006155151(A) 申请公布日期 2006.06.15
申请号 JP20040343801 申请日期 2004.11.29
申请人 ABIKO HAJIME 发明人 ABIKO HAJIME
分类号 G06F17/30 主分类号 G06F17/30
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