发明名称 |
SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide an FET capable of satisfying both high breakdown voltage and low on-resistance. SOLUTION: The FET is configured so that a part of a first hetero-semiconductor region 4 having a bandgap different from that of a substrate region 1 is formed on a second hetero-semiconductor region 3 so as to contact a drain region 2 formed on the substrate region 1, and so that the thickness of a channel of the first hetero-semiconductor region 4 contacting a gate electrode 6 via at least a gate insulating film 5 is formed to be thinner than the sum of the thickness of the second hetero-semiconductor region 3 on a portion where the second hetero-semiconductor region 3 and the first hetero-semiconductor region 4 are laminated, and the thickness of the first hetero-semiconductor region 4. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007243148(A) |
申请公布日期 |
2007.09.20 |
申请号 |
JP20060324250 |
申请日期 |
2006.11.30 |
申请人 |
NISSAN MOTOR CO LTD |
发明人 |
HAYASHI TETSUYA;YAMAGAMI SHIGEHARU;HOSHI MASAKATSU;SHIMOIDA YOSHIO;TANAKA HIDEAKI |
分类号 |
H01L29/78;H01L21/336;H01L29/12 |
主分类号 |
H01L29/78 |
代理机构 |
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主权项 |
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地址 |
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