PHOTONIC DEGRADATION MONITORING FOR SEMICONDUCTOR DEVICES

摘要

Methods of testing a semiconductor, and semiconductor testing apparatus, are described. In an example, a method for testing a semiconductor can include applying light on the semiconductor to induce photonic degradation. The method can also include receiving a photoluminescence measurement induced from the applied light from the semiconductor and monitoring the photonic degradation of the semiconductor from the photoluminescence measurement.

主权项

1. A method for testing a solar cell, the method comprising:
inducing photonic degradation, wherein the inducing includes applying light to the solar cell; and monitoring the photonic degradation of the solar cell based on a photoluminescence measurement, wherein the monitoring includes receiving a first photoluminescence measurement induced from the applied light and receiving a second photoluminescence measurement induced from the applied light after the first photoluminescence measurement.