| 发明名称 |
Particle Detector for Particulate Matter Accumulated on a Surface |
| 摘要 |
Particle detectors and methods for detecting particulate matter accumulated on a surface are provided. According to one aspect, the particle detector may comprise a substrate, an optical light source configured to emit light along a light path, a waveguide associated with the substrate, having a surface exposed to a gaseous environment and configured to accumulate on the surface particulate matter from the gaseous environment, a detector configured to receive the emitted light from the waveguide, and a controller configured to determine the intensity of the detected light and output an indication of an opacity of the surface of the waveguide with the accumulated particulate matter. |
| 申请公布号 |
US2016370282(A1) |
申请公布日期 |
2016.12.22 |
| 申请号 |
US201514746739 |
申请日期 |
2015.06.22 |
| 申请人 |
Sharp Laboratories of America, Inc. |
发明人 |
Zhan Changqing;Schuele Paul John |
| 分类号 |
G01N15/14;G01N21/59 |
主分类号 |
G01N15/14 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A particle detector comprising:
a substrate, an optical light source configured to emit light along a light path; a waveguide associated with the substrate, having a surface exposed to a gaseous environment and configured to accumulate directly on the surface particulate matter from the gaseous environment; a detector configured to receive the emitted light from the waveguide; and a controller configured to determine an intensity of the detected light, and output an indication of an opacity of the surface of the waveguide with the accumulated particulate matter. |
| 地址 |
Camas WA US |
