| 摘要 |
The present invention relates to a module substrate testing device which enables minimization of cost for changing a test apparatus by minimizing the changes in constitution during testing of various substrates having component modules and which prevents defrauding of components by some workers during testing of the function of a module substrate. A module substrate testing device having connecting pins, according to the present invention, comprises: a body which has a storage space therein; an upper cover which is fixed on the upper side of the body and has formed a through portion on a part of the area thereof; an interface board which has a pin block provided on the through portion and connecting to the connecting pins, has a lower-side connection port on the lower side thereof, and connects pins, comprised in the pin block, to the lower-side connection port; a testing jig which has a mounting portion for mounting a module substrate; a test pin connecting apparatus; a main board; an in/out testing board; and a power supplying board. |
