Automatic test apparatus for functional digital testing of multiple semiconductor integrated circuit devices

摘要

An automatic test apparatus for testing the digital functionality of multiple semiconductor integrated circuit devices simultaneously connected to the apparatus generates data patterns suitable for testing at least one of the devices. Stimulus test signals of the data patterns are replicated and distributed to the devices. Expected response signals of the devices for the test signals are also replicated and distributed to comparators for comparing the actual response of the devices with the expected response.

主权项

1. An automatic test apparatus for functional digital testing of semiconductor integrated circuit devices comprising means for dynamically transforming stored instructions into data patterns suitable for testing at least one of said semiconductor integrated circuit devices, means for electrically distributing said data patterns to replicate stimulus test signals for multiple said semiconductor integrated circuit devices, means for applying said stimulus test signals to said multiple semiconductor integrated circuit devices, means for electrically distributing said data patterns to replicate expected responses of said multiple semiconductor integrated circuit devices, means for comparing said expected responses to actual responses of said multiple semiconductor integrated circuit devices.