发明名称 |
METHOD AND APPARATUS FOR PROTECTING METAL INTERCONNECT FROM HALOGEN BASED PRECURSORS |
摘要 |
A method and apparatus for forming an interconnect on a substrate is provided. A protective layer is formed on the substrate and in a via formed on the substrate wherein the protective layer is resistant to a halogen containing material. A barrier layer is formed on top of the protective layer. The barrier layer comprises a halogen containing material. A metal layer is deposited over the barrier layer. In another embodiment, the protective layer is selectively deposited in the via. |
申请公布号 |
US2016268207(A1) |
申请公布日期 |
2016.09.15 |
申请号 |
US201514711135 |
申请日期 |
2015.05.13 |
申请人 |
Applied Materials, Inc. |
发明人 |
NAIK Mehul B.;MA Paul F.;HA Tae Hong;GUGGILLA Srinivas |
分类号 |
H01L23/532;H01L23/528;H01L23/522;H01L21/768 |
主分类号 |
H01L23/532 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming an interconnect on a substrate comprising:
forming a protective layer on a first metal layer exposed through a dielectric material, the protective layer formed on the dielectric material, wherein the protective layer is resistant to a halogen based precursor; forming a barrier layer on the protective layer; and depositing a second metal layer over the barrier layer. |
地址 |
Santa Clara CA US |