发明名称 METHOD AND APPARATUS FOR PROTECTING METAL INTERCONNECT FROM HALOGEN BASED PRECURSORS
摘要 A method and apparatus for forming an interconnect on a substrate is provided. A protective layer is formed on the substrate and in a via formed on the substrate wherein the protective layer is resistant to a halogen containing material. A barrier layer is formed on top of the protective layer. The barrier layer comprises a halogen containing material. A metal layer is deposited over the barrier layer. In another embodiment, the protective layer is selectively deposited in the via.
申请公布号 US2016268207(A1) 申请公布日期 2016.09.15
申请号 US201514711135 申请日期 2015.05.13
申请人 Applied Materials, Inc. 发明人 NAIK Mehul B.;MA Paul F.;HA Tae Hong;GUGGILLA Srinivas
分类号 H01L23/532;H01L23/528;H01L23/522;H01L21/768 主分类号 H01L23/532
代理机构 代理人
主权项 1. A method of forming an interconnect on a substrate comprising: forming a protective layer on a first metal layer exposed through a dielectric material, the protective layer formed on the dielectric material, wherein the protective layer is resistant to a halogen based precursor; forming a barrier layer on the protective layer; and depositing a second metal layer over the barrier layer.
地址 Santa Clara CA US