发明名称 METHODS FOR MODIFYING AN INTEGRATED CIRCUIT LAYOUT DESIGN
摘要 A method for modifying an integrated circuit layout design includes providing an initial multiple-patterned circuit layout design comprising a first pattern exposure and a second pattern exposure; modifying the initial multiple-patterned circuit layout design by providing a subresolution assist feature to the first pattern exposure; determining whether the presence of any overlapping areas between the subresolution assist feature of the first pattern exposure and the second pattern exposure; and further modifying the initial multiple-patterned circuit layout design by: maintaining the size of any portion of the subresolution assist feature in the overlapping areas; and shrinking the size of any portion of the subresolution assist feature that is not in the overlapping areas.
申请公布号 US2016314234(A1) 申请公布日期 2016.10.27
申请号 US201615078032 申请日期 2016.03.23
申请人 GLOBALFOUNDRIES, Inc. 发明人 Hamouda Ayman
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A method for modifying an integrated circuit layout design, the method comprising: providing an initial multiple-patterned circuit layout design comprising a first pattern exposure and a second pattern exposure; modifying the initial multiple-patterned circuit layout design by providing a subresolution assist feature to the first pattern exposure; determining whether the presence of any overlapping areas between the subresolution assist feature of the first pattern exposure and the second pattern exposure; and further modifying the initial multiple-patterned circuit layout design by: maintaining the size of any portion of the subresolution assist feature in the overlapping areas; andshrinking the size of any portion of the subresolution assist feature that is not in the overlapping areas.
地址 Grand Cayman KY