发明名称 METHODS AND SYSTEMS FOR DOPANT ACTIVATION USING MICROWAVE RADIATION
摘要 A semiconductor structure includes a substrate, a source/drain (S/D) junction, and an S/D contact. The S/D junction is associated with the substrate and includes a trench-defining wall, a semiconductor layer, and a semiconductor material. The trench-defining wall defines a trench. The semiconductor layer is formed over the trench-defining wall, partially fills the trench, substantially covers the trench-defining wall, and includes germanium. The semiconductor material is formed over the semiconductor layer and includes germanium, a percentage composition of which is greater than a percentage composition of the germanium of the semiconductor layer. The S/D contact is formed over the S/D junction.
申请公布号 US2016329212(A1) 申请公布日期 2016.11.10
申请号 US201615217024 申请日期 2016.07.22
申请人 Taiwan Semiconductor Manufacturing Company Limited 发明人 TSAI CHUN-HSIUNG;YANG HUAI-TEI;YU KUO-FENG;CHEN KEI-WEI
分类号 H01L21/268;H01L29/08;H01L21/225;H01L29/32;H01L29/66;H01L21/02;H01L29/78;H01L29/167 主分类号 H01L21/268
代理机构 代理人
主权项 1. A semiconductor structure comprising: a substrate; a source/drain (S/D) junction associated with the substrate and including a trench-defining wall that defines a trench,a semiconductor layer that is formed over the trench-defining wall, that partially fills the trench, that substantially covers the trench-defining wall, and that includes germanium, anda semiconductor material that is formed over the semiconductor layer and that includes germanium, a percentage composition of which is greater than a percentage composition of the germanium of the semiconductor layer; and an S/D contact formed over the S/D junction.
地址 Hsinchu TW