| 摘要 |
The invention relates to a method for positioning a substrate (140) and contacting an object (301) to be tested with a test device having an optical axis (102). The invention also relates to corresponding devices. According to said method, the substrate is applied to a holder (130) and positioned in relation to the optical axis. A contacting unit (150) is also positioned in relation to the optical axis, independently of the positioning process of the substrate. The invention thus ensures that objects to be tested located on the substrate are contacted in a flexible manner.
|
