PLASMA DOPED SEMICONDUCTOR DEVICES HAVING A DOPANT LOSS PREVENTIVE LAYER AND METHOD FOR MANUFACTURING THE SAME
摘要
PURPOSE: A plasma doped semiconductor devices having a dopant loss preventive layer and a method for manufacturing the same are provided to improve electrical properties by forming a gate electrode with a impurity loss prevention film after doping a source gas including a silicon component. CONSTITUTION: A gate dielectric layer(110) is formed on a semiconductor substrate(100). An N type gate electrode wiring(135) is formed on the gate dielectric layer. An NMOS area is covered by a photoresist solution mask and PMOS area is opened. The p type impurity is doped on the PMOS area through a plasma doping process. P type impurity plasma doping and plasma doping through a silicon source gas are performed at the same time and P-type impurity loss prevention film(140) is formed. Mask is eliminated and the gate electrode(115) is formed after cleaning.
申请公布号
KR20100013898(A)
申请公布日期
2010.02.10
申请号
KR20080075638
申请日期
2008.08.01
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
YOO, JONG RYEOL;PARK, TAI SU;KANG, JONG HOON;KIM, DONG CHAN;RYU, JEONG DO;JEONG, SEONG HOON;CHOI, SI YOUNG;SHIN, YU GYUN