| 发明名称 |
Spectrometer with Random Beam Profiles |
| 摘要 |
A spectrometer includes a light source configured to emit a beam along a beam path through a sample volume comprising an analyte. Also included is at least one detector positioned to detect at least a portion of the beam emitted by the light source, and at least one reflector positioned along the beam path intermediate the light source and the at least one detector having a surface roughness greater than a predefined level such as 20 Å RMS. |
| 申请公布号 |
US2016327479(A1) |
申请公布日期 |
2016.11.10 |
| 申请号 |
US201514703616 |
申请日期 |
2015.05.04 |
| 申请人 |
SpectraSensors, Inc. |
发明人 |
Feitisch Alfred;Dorn Peter;Tedesco James;Liu Xiang |
| 分类号 |
G01N21/39;G01J3/02 |
主分类号 |
G01N21/39 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An apparatus comprising:
a light source configured to emit a beam along a beam path through a sample volume comprising an analyte; at least one detector positioned to detect at least a portion of the beam emitted by the light source; and at least one reflector positioned along the beam path intermediate the light source and the at least one detector, the at least one reflector having a surface roughness greater than about 20 Å RMS. |
| 地址 |
Rancho Cucamonga CA US |
