发明名称 APPARATUS AND METHOD OF POLISHING WAFER
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an apparatus of polishing a wafer which can exactly remove a residuary metal film after polishing. <P>SOLUTION: After the wafer undergoes polishing processing, a polishing plate 1 is moved to a wafer receiving and delivering position. An exfoliating chemical nozzle 7 is arranged in the lower part of the periphery of a wafer polishing surface, a chemical nozzle 8 for protection is arranged in the lower part of the center of the wafer polishing surface, both the chemicals are discharged while the wafer 2 is rotating, and a metal film which remains in the periphery after the flattening process is removed. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006228795(A) 申请公布日期 2006.08.31
申请号 JP20050037529 申请日期 2005.02.15
申请人 TOSHIBA CORP 发明人 KAI SHUNSUKE
分类号 H01L21/304;B24B37/00 主分类号 H01L21/304
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