发明名称 Structure for phase change memory and the method of forming same
摘要 A phase change device includes a first contact electrode structure a phase change material and a first insulating material between the phase change material and the first contact electrode structure and a second contact electrode in contact with the phase change material. A contact structure formed in the first insulating material between the first contact electrode structure and the phase change material is also included. The contact structure is formed by an insulating material breakdown process. A method of forming a phase change device is also described.
申请公布号 US2008029755(A1) 申请公布日期 2008.02.07
申请号 US20070881077 申请日期 2007.07.24
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LEE MING H.;CHEN YI C.
分类号 H01L45/00;H01L27/24;H01L29/02 主分类号 H01L45/00
代理机构 代理人
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