| 摘要 |
PROBLEM TO BE SOLVED: To provide a thickness determination method and a thickness determination program capable of determining an optimum thickness of a functional layer formed in a liquid-phase process, and to provide a method of manufacturing a light-emitting element using such a thickness determination method, and a light-emitting element, and to further provide a light-emitting device including such a light-emitting element, and an electronic apparatus.SOLUTION: A thickness determination method has a step of obtaining the chromaticity thickness information about the relationship of the thickness of a functional layer and the chromaticity of the light emitted from a light-emitting element when the thickness of a functional layer is uniform, and measuring the shape information about the thickness distribution of the functional layer when formed in the liquid-phase process, and a step of determining the thickness of a functional layer, so that the chromaticity of the light emitted from a light-emitting element approaches a target chromaticity, by using the chromaticity information and shape information.SELECTED DRAWING: None |
