发明名称 On wafer testing of RFID tag circuit with pseudo antenna signal
摘要 An RFID tag circuit is described having a pair of signal paths that flow to an input of a demodulator of the RFID tag circuit. A first of the signal paths couple the demodulator to an antenna port of the RFID tag circuit. A second of the signal paths couple the demodulator to a location where a pseudo antenna signal first appears on the RFID tag circuit while the RFID tag circuit is being tested on-wafer.
申请公布号 US2006125508(A1) 申请公布日期 2006.06.15
申请号 US20060325988 申请日期 2006.01.04
申请人 发明人 GLIDDEN ROBERT M.III;COLLERAN WILLIAM T.
分类号 G01R31/26;G01R31/02;G08B21/00;H04Q5/22 主分类号 G01R31/26
代理机构 代理人
主权项
地址