发明名称 |
On wafer testing of RFID tag circuit with pseudo antenna signal |
摘要 |
An RFID tag circuit is described having a pair of signal paths that flow to an input of a demodulator of the RFID tag circuit. A first of the signal paths couple the demodulator to an antenna port of the RFID tag circuit. A second of the signal paths couple the demodulator to a location where a pseudo antenna signal first appears on the RFID tag circuit while the RFID tag circuit is being tested on-wafer.
|
申请公布号 |
US2006125508(A1) |
申请公布日期 |
2006.06.15 |
申请号 |
US20060325988 |
申请日期 |
2006.01.04 |
申请人 |
|
发明人 |
GLIDDEN ROBERT M.III;COLLERAN WILLIAM T. |
分类号 |
G01R31/26;G01R31/02;G08B21/00;H04Q5/22 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|