发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURED BY SUCH METHOD
摘要 <p>A semiconductor device having a wiring structure that is enhanced in adhesion between a dielectric thin film and a conductive layer and has high reliability is provided. A method of the invention includes: a step of supplying reactive plasma on a surface of a dielectric thin film in which a plurality of pores are arranged around a skeleton mainly made of a Si—O bond, to perform a pretreatment; a step of forming a conductive film on the surface of the pretreated dielectric thin film by a sputtering method; and before the pretreatment step, bringing a gas containing at least one kind of tetramethylcyclotetrasiloxane (TMCTS), hexamethyldisilazane (HMDS) and trimethylchlorosilane (TMCS) molecules into contact with the surface of the dielectric thin film.</p>
申请公布号 KR20070046912(A) 申请公布日期 2007.05.03
申请号 KR20077005104 申请日期 2005.09.01
申请人 ROHM CO., LTD.;ULVAC, INC.;MITSUI CHEMICALS, INC. 发明人 OKU YOSHIAKI;FUJII NOBUTOSHI;KOHMURA KAZUO
分类号 H01L21/768 主分类号 H01L21/768
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