发明名称 AUTOMATIC ANALYZER
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an automatic analyzer capable of reducing burdens on operators, by executing the analysis of an accuracy control sample by factors from the outside if the operators have prepared the accuracy control sample, in advance, executing accuracy control without fail, with appropriate timing at which accuracy control has to be performed, and automatically maintaining measurement accuracy. <P>SOLUTION: An analysis request to the accuracy control sample held in the apparatus is generated by factors, such as, holding of the accuracy control sample in the apparatus; insertion of a standard sample; satisfaction of prescribed conditions by the number of reagents under analysis (such as, "reaching zero" and "being reduced under a specified value"); changes of date; arrival at a specified time; changes in operators; exceeding the number of specimens; lapse of time; the registration of new reagents; and the detection of measurement anomalies to transfer the accuracy control sample and analyze the accuracy control sample. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008209338(A) 申请公布日期 2008.09.11
申请号 JP20070048387 申请日期 2007.02.28
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 AKUTSU MASASHI
分类号 G01N35/00;G01N35/02 主分类号 G01N35/00
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