发明名称 |
METHOD AND INSTRUMENT FOR MEASURING FINE PARTICLE |
摘要 |
PROBLEM TO BE SOLVED: To provide a fine particle measuring instrument capable of easily and inexpensively acquiring a plurality of fine particle images photographed with identical timing. SOLUTION: The fine particle measuring instrument is equipped with a flow channel pipe 10 equipped with a measuring region 12 having light transmission properties and permitting a fluid containing fine particles to pass; a supply means 14 for supplying the fluid to the flow channel pipe 10; a plurality of imaging means 20 and 30 for photographing the inside of the measuring region 12 to acquire a plurality of fine particle images; and a control means 50 for controlling the operations of the supply means 14 and the imaging means 20 and 30. The control means 50 is constituted so as to take a plurality of the fine particle images at the same time, in a state where the flow of the fluid in the measuring region 12 is temporarily stopped. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008224465(A) |
申请公布日期 |
2008.09.25 |
申请号 |
JP20070064314 |
申请日期 |
2007.03.14 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
AKIBA TATSURO |
分类号 |
G01N15/14;G01N21/27;G01N21/64 |
主分类号 |
G01N15/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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