发明名称 ION SOURCE FOR LOWER LIMITS OF DETECTION IN SPECTROMETRIC MEASUREMENTS
摘要 Ion source for lower limits of detection in mass spectrometry and ion mobility spectrometry that uses restriction of flow of gases and vapors at the outlet of ion source into the ambient atmosphere (10) and supplying an auxiliary medium into the working region of ion source (3) in order to achieve an increase of pressure in the working region of ion source (3) which leads to increase of signal intensity by order (s) of magnitude.
申请公布号 WO2009132604(A3) 申请公布日期 2010.01.28
申请号 WO2009CZ00061 申请日期 2009.04.27
申请人 PALACKY UNIVERSITY;LEMR, KAREL;RANC, VACLAV;HAVLICEK, VLADIMIR;BEDNAR, PETR;SEVCIK, JURAJ;HLAVAC, JAN;PAPOUSKOVA, BARBORA 发明人 LEMR, KAREL;RANC, VACLAV;HAVLICEK, VLADIMIR;BEDNAR, PETR;SEVCIK, JURAJ;HLAVAC, JAN;PAPOUSKOVA, BARBORA
分类号 H01J49/16;H01J49/10 主分类号 H01J49/16
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